Wemyss, T. and Phelan, J. (2005) Reduction in thermally induced displacements in an XY contouring stage through FEA analysis inspired design. In: 5th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2005, 2005-05-08 - 2005-05-11.
Full text not available from this repository. (Request a copy)Abstract
Temperature induced expansion can result in unwanted movements along all axes of precision positioning stages. As part of the development of such a stage, finite element analysis techniques were applied to test design configurations and to facilitate the convergence on optimum solutions. This extended abstract presents is a sample of the FEA work done in the design of an XY flexure stage which will form the basis for a new XYZ contouring system. A previous paper outlining in a more general context the development of this stage entitled "Movement at nano resolution in a noisy environment" was presented at the 2004 International Manufacturing Conference in Limerick, Ireland.
Item Type: | Conference or Workshop Item (Paper) |
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Uncontrolled Keywords: | /dk/atira/pure/subjectarea/asjc/2200/2209 |
Departments or Groups: | |
Depositing User: | Admin SSL |
Date Deposited: | 19 Oct 2022 23:13 |
Last Modified: | 07 Feb 2023 00:00 |
URI: | http://repository-testing.wit.ie/id/eprint/4746 |
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